发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device suitable for bipolar operation. <P>SOLUTION: A semiconductor memory device related to an embodiment comprises: a word line wiring layer including multiple word lines extending in a first direction; a bit line wiring layer including multiple bit lines extending in a second direction intersecting with the first direction; and a pillar arranged between each of the word lines and each of the bit lines. The pillar has a selector laminated film containing silicon over the whole film and a variable resistance film arranged on the word line side or the bit line side when viewed from the selector laminated film. On the selector laminated film, a heterogeneous component containing layer composed of 14-group elements having a larger atomic radius than that of silicon is formed in a part of the region except the ends of the word line side and the bit line side. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011249542(A) 申请公布日期 2011.12.08
申请号 JP20100120875 申请日期 2010.05.26
申请人 TOSHIBA CORP 发明人 KAI WAKANA;ISHIDA KOICHI
分类号 H01L27/10;G11C13/00;H01L45/00;H01L49/00 主分类号 H01L27/10
代理机构 代理人
主权项
地址