发明名称 Semiconductor Device and Method of Forming Shielding Layer After Encapsulation and Grounded Through Interconnect Structure
摘要 A method of manufacturing a semiconductor device includes providing a substrate having a conductive bump formed over the substrate and a semiconductor die with an active surface oriented to the substrate. An encapsulant is deposited over the semiconductor die and the conductive bump, and the encapsulant is planarized to expose a back surface of the semiconductor die opposite the active surface while leaving the encapsulant covering the conductive bump. A channel is formed into the encapsulant to expose the conductive bump. The channel extends vertically from a surface of the encapsulant down through the encapsulant and into a portion of the conductive bump. The channel extends through the encapsulant horizontally along a length of the semiconductor die. A shielding layer is formed over the encapsulant and the back surface of the semiconductor die. The shielding layer includes a docking pin extending into the channel and into the portion of the conductive bump to electrically connect to the conductive bump and provide isolation from inter-device interference.
申请公布号 US2011298105(A1) 申请公布日期 2011.12.08
申请号 US201113209620 申请日期 2011.08.15
申请人 CHI HEEJO;CHO NAMJU;SHIN HANGIL;STATS CHIPPAC, LTD. 发明人 CHI HEEJO;CHO NAMJU;SHIN HANGIL
分类号 H01L21/56;H01L23/552 主分类号 H01L21/56
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