Test Circuit, a Semiconductor Memory Apparatus Using the same, and Test Method of the Semiconductor Memory Apparatus,申请号KR20090093611-传众专利搜索

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发明名称	Test Circuit, a Semiconductor Memory Apparatus Using the same, and Test Method of the Semiconductor Memory Apparatus
摘要
申请公布号	KR101090393(B1)	申请公布日期	2011.12.07
申请号	KR20090093611	申请日期	2009.09.30
申请人		发明人
分类号	G11C29/00;G11C5/14;G11C7/12	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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