| 摘要 |
A method for detecting atypical electronic components for the quality control of a set of n electronic components at the end of the manufacturing process, the components being subject to a number p of unit tests providing digital data, this set of n components consisting of electronic components whose response to each of the p unit tests is contained within pre-defined limits specific to each of the p tests, uses the multidimensional information of the p dimension responses of these n electronic components. The method uses a generalized principal component analysis for detecting atypical items in the semiconductor field, or in fields including modules assembled using electronic components (e.g. an ABS module, a smart card, etc.). The aim of the method is to get close to “zero defect”, in which no parts are detected as non-compliant by the client. |
