发明名称 |
Three-dimensional shape measuring apparatus, program and three-dimensional shape measuring method |
摘要 |
A three-dimensional shape measuring apparatus (10) is an apparatus which measures a three-dimensional shape of a target object (20) by analyzing
an optical pattern (30) projected to the target object (20). The three-dimensional shape measuring apparatus (10) includes a line sensor (16) and an image analysis unit (2). The line sensor (16) reads the target object (20), onto which the optical pattern (30) is projected, as the image. The image analysis unit (2) analyzes the optical pattern (30) in the image read by the line sensor (16) based on a spatial fringe analysis method, and the image analysis unit (2) computes the three-dimensional shape information on the target object (20). |
申请公布号 |
EP1777487(B1) |
申请公布日期 |
2011.12.07 |
申请号 |
EP20060122485 |
申请日期 |
2006.10.18 |
申请人 |
OMRON CORPORATION |
发明人 |
SUWA, MASAKI;ITO, YOSHIRO;MITSUMOTO, DAISUKE;YOSHINO, MASANAO;KOITABASHI, HIROYOSHI;ASOKAWA, YOSHINOBU |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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