发明名称 Three-dimensional shape measuring apparatus, program and three-dimensional shape measuring method
摘要 A three-dimensional shape measuring apparatus (10) is an apparatus which measures a three-dimensional shape of a target object (20) by analyzing an optical pattern (30) projected to the target object (20). The three-dimensional shape measuring apparatus (10) includes a line sensor (16) and an image analysis unit (2). The line sensor (16) reads the target object (20), onto which the optical pattern (30) is projected, as the image. The image analysis unit (2) analyzes the optical pattern (30) in the image read by the line sensor (16) based on a spatial fringe analysis method, and the image analysis unit (2) computes the three-dimensional shape information on the target object (20).
申请公布号 EP1777487(B1) 申请公布日期 2011.12.07
申请号 EP20060122485 申请日期 2006.10.18
申请人 OMRON CORPORATION 发明人 SUWA, MASAKI;ITO, YOSHIRO;MITSUMOTO, DAISUKE;YOSHINO, MASANAO;KOITABASHI, HIROYOSHI;ASOKAWA, YOSHINOBU
分类号 G01B11/25 主分类号 G01B11/25
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