| 摘要 |
PURPOSE: A semiconductor device is provided to reduce test time and costs by simultaneously testing a plurality of semiconductor devices. CONSTITUTION: A first power line is connected to a first power transmission pad. A second power line is connected to a second power transmission pad. A test option unit(100) is connected to the first power line and the second power line and includes a pass gate, a transistor, and a fuse. The test option unit connects or disconnects the first power line and the second power line. The pass gate and the transistor are activated according to a probe test signal.
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