发明名称 Apparatus and method for a combined interferometric and image based geometric determination, particularly in the microsystem technology
摘要 The apparatus and method according to the invention includes an objective (8) which is capable of operating basically in two different measuring modes. In a first interference mode, a measuring object (9) is interference—optically measured. In a second imaging operating mode on a detector array (12) designed like a camera, an optical image is generated, which is supplied to an image processing routine. The switching over between the two operating modes occurs by switching the illumination devices which are associated with different locations of the beam path of the apparatus—when viewed from the camera, one in front of a beam divider and the other behind the beam divider, which couples a reference light path to the beam path.
申请公布号 US8072608(B2) 申请公布日期 2011.12.06
申请号 US20080290063 申请日期 2008.10.27
申请人 STEFFENS NORBERT;LEHMANN PETER;CARL MAHR HOLDING GMBH 发明人 STEFFENS NORBERT;LEHMANN PETER
分类号 G01B9/02 主分类号 G01B9/02
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