发明名称 Nonvolatile semiconductor memory device
摘要 A memory cell includes a floating gate electrode, a first inter-electrode insulating film and a control gate electrode. A peripheral transistor includes a lower electrode, a second inter-electrode insulating film and an upper electrode. The lower electrode and the upper electrode are electrically connected via an opening provided on the second inter-electrode insulating film. The first and second inter-electrode insulating films include a high-permittivity material, the first inter-electrode insulating film has a first structure, and the second inter-electrode insulating film has a second structure different from the first structure.
申请公布号 US8072021(B2) 申请公布日期 2011.12.06
申请号 US20080188617 申请日期 2008.08.08
申请人 GOMIKAWA KENJI;IGUCHI TADASHI;NOGUCHI MITSUHIRO;WATANABE SHOICHI;KABUSHIKI KAISHA TOSHIBA 发明人 GOMIKAWA KENJI;IGUCHI TADASHI;NOGUCHI MITSUHIRO;WATANABE SHOICHI
分类号 H01L29/788 主分类号 H01L29/788
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