发明名称 Lithography systems and processes
摘要 An exemplary lithography process may include: receiving a substrate having a photo-sensitive layer; providing a light source capable of causing an exposure of a portion of the photo-sensitive layer; and providing a mask capable of defining at least one pattern that is to be transferred to the photo-sensitive layer. Specifically, the substrate has a top surface on or over the photo-sensitive layer, and the mask receives an electromagnetic wave from the light source at a first surface of the mask and generates a plurality of electromagnetic components from a second surface of the mask. The lithography process may also include: providing a lens, which provides a flat surface at a bottom surface of the lens, for transferring the pattern to the photo-sensitive layer; and adjusting the distance between the flat surface of the lens and the top surface of the substrate to control the number and amount of the electro-magnetic components projected onto the photo-sensitive layer.
申请公布号 US8072577(B2) 申请公布日期 2011.12.06
申请号 US20060422284 申请日期 2006.06.05
申请人 WU TZONG HSIEN;YANG TA HUNG;LU CHIH YUAN;MACRONIX INTERNATIONAL CO., LTD. 发明人 WU TZONG HSIEN;YANG TA HUNG;LU CHIH YUAN
分类号 G02B7/02;G03B27/32;G03B27/52;G03B27/54 主分类号 G02B7/02
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