METHOD AND CIRCUIT ARRANGEMENT FOR NON-DESTRUCTIVE EXAMINATION OF OBJECTS BY MEANS OF ULTRASONIC WAVES

摘要

The present invention relates to a method for processing signals which are generated during the non-destructive examination of objects by reflection of ultrasonic waves at defect locations of the structure of the object. The method includes emitting a single complete wave front onto at least one section of the object to be examined by means of a plurality of independent transmitter elements. The method includes receiving a wave reflected by the structure of the object by means of a plurality of receiver elements which are independent of one another. The plurality of transmitter and receiver elements constitutes a probe. The method includes digitalizing the signals received from the receiver elements. The method includes storing the digitalized signals according to amplitude and propagation time in a storage element. The method includes detecting the defect locations by a phase-locked addition of the stored amplitude values along a propagation time.