发明名称 Method for the wet-chemical treatment of a semiconductor wafer
摘要 A method for the wet-chemical treatment of a semiconductor wafer involves: a) rotating a semiconductor wafer; b) applying a cleaning liquid comprising gas bubbles having a diameter of 100 μm or less to the rotating wafer such that a liquid film forms on the wafer; c) exposing the rotating semiconductor wafer to a gas atmosphere containing a reactive gas; and d) removing the liquid film from the wafer.
申请公布号 US8070882(B2) 申请公布日期 2011.12.06
申请号 US20080326969 申请日期 2008.12.03
申请人 SCHWAB GUENTER;ZAPILKO CLEMENS;BUSCHHARDT THOMAS;FEIJOO DIEGO;HAIBARA TERUO;MORI YOSHIHIRO;SILTRONIC AG 发明人 SCHWAB GUENTER;ZAPILKO CLEMENS;BUSCHHARDT THOMAS;FEIJOO DIEGO;HAIBARA TERUO;MORI YOSHIHIRO
分类号 B08B7/00 主分类号 B08B7/00
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