发明名称 FLASH MEMORY HAVING TEST MODE FUNCTION AND CONNECTION TEST METHOD FOR FLASH MEMORY
摘要 A flash memory including a controller, the controller including: a state machine; a state decoder that determines whether a state of the state machine is in a specified mode; a command decoder that determines whether an input signal received through an external pin specifies a write operation for writing a specific value into a specific address; and a test mode setting circuit that sets a test mode while the specified mode is maintained when the state decoder determines that the state of the state machine is in the specified mode and when the command decoder determines that the input signal received through the external pin specifies a write operation for writing a specific value into a specific address.
申请公布号 US2011296086(A1) 申请公布日期 2011.12.01
申请号 US201113112256 申请日期 2011.05.20
申请人 SAITOU MASAHIRO;FUJITSU LIMITED 发明人 SAITOU MASAHIRO
分类号 G06F12/02 主分类号 G06F12/02
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