发明名称 Stacked Semiconductor Memory Device, Memory System Including The Same, And Method Of Repairing Defects Of Through Silicon Vias
摘要 A stacked semiconductor memory device according to the inventive concepts may include a plurality of memory chips stacked above a processor chip, a plurality of TSVs, and I/O buffers. The TSVs may pass through the memory chips and are connected to the processor chip. I/O buffers may be coupled between all or part of the memory chips and the TSVs and may be selectively activated on the basis of defective states of the TSVs.
申请公布号 US2011292742(A1) 申请公布日期 2011.12.01
申请号 US201113085776 申请日期 2011.04.13
申请人 OH TAE-YOUNG;PARK KWANG-IL;YANG YUN-SEOK;SOHN YOUNG-SOO;KIM SI-HONG;BAE SEUNG-JUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 OH TAE-YOUNG;PARK KWANG-IL;YANG YUN-SEOK;SOHN YOUNG-SOO;KIM SI-HONG;BAE SEUNG-JUN
分类号 G11C7/10;H01L23/48 主分类号 G11C7/10
代理机构 代理人
主权项
地址