发明名称 METHOD AND APPARATUS FOR DEFECT DETECTION
摘要 A system for detecting a defect in a membranous article (20) comprising: an emitter probe (10) connected to an electrical supply (14), said probe (10) insertable into a cavity of said article (20); a sensor (15) for receiving an electrical discharge from said probe (10); a conveyor system for bringing the probe and sensor into mutual proximity; a processor for measuring the potential difference between the probe and sensor, said processor capable of detecting a defect based upon said measurement.
申请公布号 US2011291677(A1) 申请公布日期 2011.12.01
申请号 US200913061914 申请日期 2009.09.02
申请人 BODEA DANIEL-CONSTANTIN;HAMPE PATRICK;TGT ENTERPRISES LTD. 发明人 BODEA DANIEL-CONSTANTIN;HAMPE PATRICK
分类号 G01N27/20 主分类号 G01N27/20
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