| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide means for rewriting by detecting the optimal time for rewriting in a nonvolatile memory even if the nonvolatile memory is attached and detached on a terminal device with a nonvolatile memory. <P>SOLUTION: The terminal device comprises a high temperature detection counter circuit for detecting the temperature inside the device and outputting an interruption signal according to the detected temperature. The time at which data is written, and system time and stress acceleration immediately before stop of the device are recorded in block management areas in a nonvolatile memory. At restart of the device, the stress acceleration time is continuously counted from the one immediately before the stop of the device, which enables the nonvolatile memory to be rewritten by detecting an optimal time for rewriting even if the nonvolatile memory is attached and detached. <P>COPYRIGHT: (C)2012,JPO&INPIT |
