发明名称 CONNECTOR AND SEMICONDUCTOR TESTING APPARATUS HAVING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To reduce a crosstalk resulting from an electromagnetic wave generated from a connection part of a signal terminal. <P>SOLUTION: A ground terminal 4 includes a cylindrical body 41. The signal terminal 3 includes a terminal body 31 disposed inside the cylindrical body 41 and a connection plate part 34 extending from an edge of the terminal body 31. The ground terminal 4 also includes at least 3 connection plate parts 43, 44 that extend respectively from mutually different positions in an edge of the cylindrical body 41 and that are disposed so as to enclose the connection plate part 34 of the signal terminal 3. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011243414(A) 申请公布日期 2011.12.01
申请号 JP20100114461 申请日期 2010.05.18
申请人 ADVANTEST CORP;MOLEX JAPAN CO LTD 发明人 WAGATA HIROTAKA;KAMISAKA AKIRA;WATANABE JUN;MIZUMURA AKINORI
分类号 H01R24/38;G01R1/04;G01R31/28;H01R12/71;H01R12/77 主分类号 H01R24/38
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