发明名称 |
CONNECTOR AND SEMICONDUCTOR TESTING APPARATUS HAVING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To reduce a crosstalk resulting from an electromagnetic wave generated from a connection part of a signal terminal. <P>SOLUTION: A ground terminal 4 includes a cylindrical body 41. The signal terminal 3 includes a terminal body 31 disposed inside the cylindrical body 41 and a connection plate part 34 extending from an edge of the terminal body 31. The ground terminal 4 also includes at least 3 connection plate parts 43, 44 that extend respectively from mutually different positions in an edge of the cylindrical body 41 and that are disposed so as to enclose the connection plate part 34 of the signal terminal 3. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011243414(A) |
申请公布日期 |
2011.12.01 |
申请号 |
JP20100114461 |
申请日期 |
2010.05.18 |
申请人 |
ADVANTEST CORP;MOLEX JAPAN CO LTD |
发明人 |
WAGATA HIROTAKA;KAMISAKA AKIRA;WATANABE JUN;MIZUMURA AKINORI |
分类号 |
H01R24/38;G01R1/04;G01R31/28;H01R12/71;H01R12/77 |
主分类号 |
H01R24/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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