发明名称 HIGH-SPEED SENSING FOR RESISTIVE MEMORIES
摘要 Embodiments of the present disclosure use one or more gain stages to generate an output voltage representing whether a resistive memory element of a data cell stores a high data value or a low data value. In a particular embodiment, an apparatus includes a sensing circuit. The sensing circuit includes a first amplifier stage that is configured to convert a first current through a first resistive memory element of a memory cell into a first single-ended output voltage. A second amplifier stage is configured to amplify the first single-ended output voltage of the first amplifier stage to produce a second single-ended output voltage.
申请公布号 US2011291761(A1) 申请公布日期 2011.12.01
申请号 US20100791284 申请日期 2010.06.01
申请人 RAO HARI M.;QUALCOMM INCORPORATED 发明人 RAO HARI M.
分类号 H03F3/16 主分类号 H03F3/16
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