FLEXIBLE STORAGE INTERFACE TESTER WITH VARIABLE PARALLELISM AND FIRMWARE UPGRADEABILITY
摘要
A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmable to provide test patterns for use in automated test equipment. The configurable IC includes a configurable interface core that is programmable to provide functionality of one or more protocol based interfaces for a device under test (DUT) and is programmable to interface with the DUT. The system also includes a connection configurable to couple the configurable IC to the DUT.
申请公布号
WO2011149725(A2)
申请公布日期
2011.12.01
申请号
WO2011US36899
申请日期
2011.05.18
申请人
VERIGY (SINGAPORE) PTE. LTD.;FILLER, SCOTT;VOLKERINK, HENDRIK, JAN (ERIK);TANTAWY, AHMED, SAMI
发明人
FILLER, SCOTT;VOLKERINK, HENDRIK, JAN (ERIK);TANTAWY, AHMED, SAMI