发明名称 METHOD FOR MEASURING PHASE TRANSIENT RESPONSE
摘要 <P>PROBLEM TO BE SOLVED: To automatically obtain a flattened phase transient response without any user intervention by measuring the phase transient response of a device to be measured. <P>SOLUTION: When an output signal of the device to be measured steps from a first frequency to a second frequency, an instantaneous phase waveform is calculated on the basis of an instantaneous voltage waveform which represents the output signal of the device to be measured. On the basis of the instantaneous phase waveform, an instantaneous frequency waveform is calculated. Without any user intervention, the second frequency is estimated on the basis of the instantaneous frequency waveform. Then, the instantaneous phase waveform is flattened on the basis of an estimated value of the second frequency. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011242399(A) 申请公布日期 2011.12.01
申请号 JP20110112386 申请日期 2011.05.19
申请人 TEKTRONIX INC 发明人 KATHERINE A ENGHOLM;SORAYA J MATOS;SHIGETSUNE TORIN
分类号 G01R23/10 主分类号 G01R23/10
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