发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A non-volatile memory device and a manufacturing thereof are provided to prevent silicon migration in forming a first control gate film by crystallizing first and second reserved silicon films which have different compositions. CONSTITUTION: In a non-volatile memory device and a manufacturing thereof, a semiconductor substrate(100) is formed into a single-crystal silicon. An element isolation pattern(110) is arranged inside a trench(101). A tunnel oxide layer pattern(120) is arranged in the top side of an active region which is defined by the element isolation pattern. The top side of the tunnel oxide layer pattern is lower than that of the element isolation pattern. A Floating gate pattern(200) is arranged on a first dielectric layer pattern.
申请公布号 KR20110129079(A) 申请公布日期 2011.12.01
申请号 KR20100048511 申请日期 2010.05.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEOK HOON;JEE, JUNG GEUN;SHIN, SU JIN;LEE, WOO SUNG;KWON, TAE OUK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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