发明名称 MEMORY LEAKAGE AND DATA RETENTION CONTROL
摘要 A circuit with leakage and data retention control includes at least one memory cell in a first memory array. The at least one memory cell is coupled to a first power supply voltage and a virtual ground. The circuit includes a current source and an NMOS transistor. The drain of the NMOS transistor is coupled to the virtual ground and the gate of the NMOS transistor is coupled to the current source.
申请公布号 US2011292753(A1) 申请公布日期 2011.12.01
申请号 US20100788860 申请日期 2010.05.27
申请人 HSU KUOYUAN (PETER);TANG YUKIT;CHANG JACKLYN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSU KUOYUAN (PETER);TANG YUKIT;CHANG JACKLYN
分类号 G11C5/14 主分类号 G11C5/14
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