发明名称 PHOTOELECTRIC CONVERSION DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a photoelectric conversion device having defects suppressed as much as possible by selectively filling a structure defect such as a pin hole or a crack of a semiconductor film with an insulation resin, and a manufacturing method of the photoelectric conversion device. <P>SOLUTION: A manufacturing method of a photoelectric conversion device comprises forming on a substrate, a first electrode, a first impurity semiconductor layer, an intrinsic semiconductor layer, and a second impurity semiconductor layer; specifying the position of a structure defect in the semiconductor layer or in a part thereof by using means for detecting the structure defect; discharging a liquid insulation resin material to the structure defect or the periphery thereof by using means for discharging a liquid, filling the inside of the structure defect with the insulation resin material; curing the insulation resin material by using means for curing the insulation resin material, and forming a second electrode on the second impurity semiconductor layer and the cured insulation resin. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011243970(A) 申请公布日期 2011.12.01
申请号 JP20110094881 申请日期 2011.04.21
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 NISHI KAZUO;NISHIDA JIRO;MAEDA YASUSHI;HIROSE TAKASHI
分类号 H01L31/04;H01L31/042 主分类号 H01L31/04
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