| 摘要 |
A method of testing integrated circuits is provided. The method includes establishing at least one first physical communication channel between a test equipment and a respective group of integrated circuits under test by having probes of the test equipment contacting at least one corresponding physical contact terminal of each integrated circuit of the respective group. The method further includes having the test equipment exchanging, over the at least one first physical communication channel, the same test stimuli with each integrated circuit of the group. The method still further includes having each integrated circuit of the group establishing a corresponding second physical communication channel with the test equipment by having at least one physical contact terminal of the integrated circuit contacted by a corresponding probe of the test equipment. The method further includes having each integrated circuit of the group exchanging, over the second physical communication channel, a corresponding test response signal based on the received test stimuli with the test equipment. The test stimuli are exchanged by modulating at least one first carrier wave based on the test stimuli; the at least one first carrier wave has at least one first frequency. The test response signals of each integrated circuit of the group are exchanged by modulating at least one respective second carrier wave based on the test response signals; each second carrier wave have at least one respective second frequency. |
