PIN CARD AND TEST APPARATUS USING THE SAME

摘要

A first switch is arranged such that a first terminal thereof is connected to an AC test unit and a second terminal thereof is connected to an I/O terminal and a DC test unit. A first switch is configured so as to be capable of switching states between a connection state in which the first terminal and the second terminal are connected to each other, and a disconnection state in which they are disconnected from each other. A bypass capacitor is arranged between the first terminal and the second terminal, and is configured to bypass the frequency component which is cut off by the first switch.