发明名称 A specially in-situ calibrated atomic force microscope for usage in characterization and classification methods for functional biological and organic objects
摘要 Claimed is an apparatus comprising an by using any of the methods of GB1012395.8 in-situ calibrated atomic force microscope, which is here applied to quantitatively measuring normal and lateral forces, elasticities and viscosities and of course spatial measures on biological/organic objects. In particular, elasticities, viscosities and mechanical resonance frequencies are quantitatively evaluated, in particular based on the "vertical" (normal and lateral tip forces, sample elasticities and heights, tip-sample-distance) in-situ calibration following the methods in GB1012395.8 of this particular atomic force microscopy e.g. for a typological classification of various biological/organic objects for instance for distinguishing healthy from sick cells or cell-organelles and for designing physical methods to specifically destroy e.g. sick cells or virulent particles in a living organism. Furthermore, receptor binding forces are quantified, in particular exploiting calibrated lateral tip forces. Finally, the method for standardizing the effective sample temperature on a small spatial scale via in-situ detecting by AFM the in particular 2-dimensional crystallization parameters of nanoparticles can be applied as a spin-off application for repairing materials like glass windows.
申请公布号 GB201117945(D0) 申请公布日期 2011.11.30
申请号 GB20110017945 申请日期 2010.07.23
申请人 OHNESORGE, FRANK M 发明人
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