发明名称 |
SPECIMEN FOR TEST OF LIGHT EMITTING DIODE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: An LED measurement sample and a manufacturing method thereof are provided to improve productivity by measuring an electrical characteristic value and an optical characteristic value in a semi-product level and reducing process time. CONSTITUTION: A pre cure process is executed(S100). One side terminal of a lead frame is cut(S200). Resin and fluorescent substance are inserted and are hardened in a fixed time(S300). The resin is silicone resin. The fixed time is 35~45 minutes. The one side terminal is positive terminal. A reflective cup is formed in both sides of the upper surface of the lead frame. An LED chip is mounted on the upper surface of the lead frame. The lead frame is projected in both directions of the LED chip.
|
申请公布号 |
KR20110128603(A) |
申请公布日期 |
2011.11.30 |
申请号 |
KR20100048133 |
申请日期 |
2010.05.24 |
申请人 |
LG INNOTEK CO., LTD. |
发明人 |
KIM, MYUNG SUN;JIN, HEE YEL;KIM, GYUNG MAN;OK, SUNG MUN;PARK, SUNG CHUL |
分类号 |
G01R31/02;G01N1/28;G01R3/00 |
主分类号 |
G01R31/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|