发明名称 |
ADVANCED INSPECTION METHOD UTILIZING SHORT PULSES LED ILLUMINATION |
摘要 |
<p>PURPOSE: An improved inspecting method using an LED lamp of a short pulse is provided to use a strip cable, thereby reducing distortion induced from a pulse current. CONSTITUTION: A strip cable(230) includes a form factor and a plurality of conductors. An LED group is coupled with an LED driver by the strip cable. The LED driver operates an operating signal which has short time for maintaining a high current through the strip cable to operate the LED group. The LED group generates a light pulse in response to an operating signal which has short time for maintaining a high current.</p> |
申请公布号 |
KR20110128750(A) |
申请公布日期 |
2011.11.30 |
申请号 |
KR20110049130 |
申请日期 |
2011.05.24 |
申请人 |
CAMTEK LTD. |
发明人 |
MENACHEM AMNON;CHERBIS YOSSI;NATAN ARNON BEN |
分类号 |
F21V9/10;F21S2/00;F21V5/00;H05B37/02 |
主分类号 |
F21V9/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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