发明名称 ADVANCED INSPECTION METHOD UTILIZING SHORT PULSES LED ILLUMINATION
摘要 <p>PURPOSE: An improved inspecting method using an LED lamp of a short pulse is provided to use a strip cable, thereby reducing distortion induced from a pulse current. CONSTITUTION: A strip cable(230) includes a form factor and a plurality of conductors. An LED group is coupled with an LED driver by the strip cable. The LED driver operates an operating signal which has short time for maintaining a high current through the strip cable to operate the LED group. The LED group generates a light pulse in response to an operating signal which has short time for maintaining a high current.</p>
申请公布号 KR20110128750(A) 申请公布日期 2011.11.30
申请号 KR20110049130 申请日期 2011.05.24
申请人 CAMTEK LTD. 发明人 MENACHEM AMNON;CHERBIS YOSSI;NATAN ARNON BEN
分类号 F21V9/10;F21S2/00;F21V5/00;H05B37/02 主分类号 F21V9/10
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