发明名称 X-RAY INSPECTION APPARATUS
摘要 PURPOSE: An X-ray inspection device is provided to consecutively configure first and second directors on a conveyor in a progressing direction, thereby realizing accurate check at shorter time. CONSTITUTION: A conveyor transfers an object of a case to be measured from an inlet to an outlet. An X-ray tube(200) applies X-ray in the lower part of the conveyor. The X-ray tube is inclined toward one side in the lower part of the X-ray tube. A detector is arranged on the top of the conveyor. A first detector(310) and a second detector(320) are consecutively arranged on the conveyor in a progressing direction.
申请公布号 KR20110128478(A) 申请公布日期 2011.11.30
申请号 KR20100047951 申请日期 2010.05.24
申请人 XAVIS CO., LTD. 发明人 JEON, BYUNG KEUN;KIM, CHUNG JIN;AHN, JI HOON;KIM, HYEONG CHEOL;HA, WAN
分类号 H05K13/08;H05G1/02;H05K13/02 主分类号 H05K13/08
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