发明名称 |
Semiconductor wafer including semiconductor chips divided by scribe line and process-monitor electrode pads formed on scribe line |
摘要 |
The present invention discloses a semiconductor wafer having a scribe line dividing the semiconductor wafer into a matrix of plural semiconductor chips. The semiconductor wafer includes a polysilicon layer, a poly-metal interlayer insulation film formed on the polysilicon layer, and a first metal wiring layer formed on the poly-metal interlayer insulation film. The semiconductor wafer includes a process-monitor electrode pad formed on a dicing area of the scribe line. The process-monitor electrode pad has a width greater than the width of the dicing area. The process-monitor electrode pad includes a contact hole formed in the poly-metal insulation film for connecting the first metal wiring layer to the polysilicon layer. |
申请公布号 |
US8067819(B2) |
申请公布日期 |
2011.11.29 |
申请号 |
US20060794649 |
申请日期 |
2006.11.22 |
申请人 |
YOSHIDA MASAAKI;KOUNO SATOSHI;RICOH COMPANY, LTD. |
发明人 |
YOSHIDA MASAAKI;KOUNO SATOSHI |
分类号 |
H01L23/544 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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