发明名称 Semiconductor wafer including semiconductor chips divided by scribe line and process-monitor electrode pads formed on scribe line
摘要 The present invention discloses a semiconductor wafer having a scribe line dividing the semiconductor wafer into a matrix of plural semiconductor chips. The semiconductor wafer includes a polysilicon layer, a poly-metal interlayer insulation film formed on the polysilicon layer, and a first metal wiring layer formed on the poly-metal interlayer insulation film. The semiconductor wafer includes a process-monitor electrode pad formed on a dicing area of the scribe line. The process-monitor electrode pad has a width greater than the width of the dicing area. The process-monitor electrode pad includes a contact hole formed in the poly-metal insulation film for connecting the first metal wiring layer to the polysilicon layer.
申请公布号 US8067819(B2) 申请公布日期 2011.11.29
申请号 US20060794649 申请日期 2006.11.22
申请人 YOSHIDA MASAAKI;KOUNO SATOSHI;RICOH COMPANY, LTD. 发明人 YOSHIDA MASAAKI;KOUNO SATOSHI
分类号 H01L23/544 主分类号 H01L23/544
代理机构 代理人
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