发明名称 Semiconductor device having recess channel structure and method for manufacturing the same
摘要 A semiconductor device having a recess channel structure includes a semiconductor substrate having a recess formed in a gate forming area in an active area; an insulation layer formed in the semiconductor substrate so as to define the active area and formed so as to apply a tensile stress in a channel width direction; a stressor formed in a surface of the insulation layer and formed so as to apply a compressive stress in a channel height direction; a gate formed over the recess in the active area; and source/drain areas formed in a surface of the active area at both side of the gate.
申请公布号 US8067799(B2) 申请公布日期 2011.11.29
申请号 US20100947742 申请日期 2010.11.16
申请人 CHOI KANG SIK;HYNIX SEMICONDUCTOR INC. 发明人 CHOI KANG SIK
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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