发明名称 WAVEFORM GENERATOR AND SEMICONDUCTOR TESTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To make an output waveform pattern freely changeable when outputting a desired waveform by controlling a plurality of timing edge generation circuits. <P>SOLUTION: A waveform generator equipped with a waveform generation unit 2 for generating a waveform comprises: a plurality of timing edge generation circuits 14 for generating timing edges TE on the basis of timing data TD that specifies timings for changing edges; a table storage section 22 for storing a rewritable truth table TT that specifies the timing edge generation circuits 14 to be driven; a drive control section 23 for driving the timing edge generation circuits 14 according to a waveform to be generated on the basis of the truth table TT; and a plurality of timing data output section 12 for inputting the timing data TD to the timing edge generation circuits to be driven on the basis of the truth table TT. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011237236(A) 申请公布日期 2011.11.24
申请号 JP20100107920 申请日期 2010.05.10
申请人 YOKOGAWA ELECTRIC CORP 发明人 MIYAZAKI NAOKI
分类号 G01R31/3183 主分类号 G01R31/3183
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