发明名称 LIGHT-EMITTING COMPONENT TEST MODULE AND LIGHT-EMITTING COMPONENT TEST APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a light-emitting component test module capable of testing a light-emitting component mounting a semiconductor light-emitting element in an environment at a temperature that is higher or lower than a normal temperature, without mounting the light-emitting component on a substrate or the like, and to provide a light-emitting component test apparatus. <P>SOLUTION: A light-emitting component test module 10 includes: a base substance 21 having a plurality of recessed parts 211 provided one surface thereof; a plurality of elastic bodies 22 embedded in the plurality of the recessed parts 211 of the base substance 21 respectively; a flexible film 30 having a wiring which is provided in contact with one surface of the base substance 21 having the plurality of the elastic bodies 22 embedded in the plurality of the recessed parts 211, and is electrically connected to a plurality of light-emitting components 2 arranged on the plurality of the elastic bodies 22, formed therein; and a holding body 24 for pressing the plurality of the light-emitting components 2 to the plurality of the elastic bodies 22 embedded in the plurality of the recessed parts 211 of the base substance 21 respectively through the flexible film 30. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011237350(A) 申请公布日期 2011.11.24
申请号 JP20100110589 申请日期 2010.05.12
申请人 SHOWA DENKO KK 发明人 TOMITA HIROYUKI
分类号 G01R31/26;H01L33/00 主分类号 G01R31/26
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