发明名称 TEST ITEM GENERATION DEVICE, METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To extract threshold value test items (test path) with high correctness including an upper limit value, a vicinity value, and an abnormal value, and only items sufficiently needed for threshold value test in the early stage of development. <P>SOLUTION: This invention comprises the following steps of: reading a flow diagram in a design model to obtain a user defined loop maximum passage count which is defined as an upper limit of loop frequency by a user terminal; reading all nodes and edges in the flow diagram of the design model to determine a test path extracted by searching for a path from a beginning edge to a ending edge which passes through a loop with the frequency specified by the user defined loop maximum passage count, and count a loop appearance frequency, that is a frequency of appearance of the loop in the test path; comparing the counted loop appearance frequency M with the user defined loop maximum passage count N; and outputting a test item determined as the test path for the threshold test value. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011237991(A) 申请公布日期 2011.11.24
申请号 JP20100108361 申请日期 2010.05.10
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 TANNO HARUTO;ZHANG XIAO JING;HOSHINO TAKASHI
分类号 G06F11/28 主分类号 G06F11/28
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