| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection device which can well perform inspection of a defect in an emission state regardless of types of line heads. <P>SOLUTION: The inspection device has a light receiving device 11 which has two or more photoelectric converting elements and converts a quantity of light of an emission light L to an electric signal by receiving the emission light L emitted from each of two or more light sources, and a detecting device 12 which detects defects of light sources on the basis of the electric signals. The two or more photoelectric converting elements are arranged in the shape of a two-dimensional matrix in mutually crossing directions. The elements are arranged to be longer than the length in the longitudinal direction of the line head in one direction. A separation distance between the photoelectric converting elements is set to be shorter than a distance between centers in spots of two or more emission light beams radiated on the light receiving means. The detecting device 12 calculates a quantity of light for every spot by integrating quantities of light of the emission lights L shown by the electric signals in a direction which intersects an arrangement direction of two or more spots, compares the quantity of light of the spot with a control width which defines an upper limit value and a lower limit value of the quantity of light, and detects the light source which has the quantity of light deviated from the control width as a defect. <P>COPYRIGHT: (C)2012,JPO&INPIT |
