发明名称 REFLECTIVE PHOTOMASK, MANUFACTURING METHOD OF THE PHOTOMASK, AND PATTERN FORMATION METHOD
摘要 A reflective photomask includes a phase shift portion, a reflective portion located outside the phase shift portion; and a semi-light-absorbing portion located between the phase shift portion and the reflective portion. The semi-light-absorbing portion includes a first multilayer film reflective to exposure light, a first interlayer film, a second multilayer film, a second interlayer film, and a third multilayer film. The phase shift portion is the first multilayer film exposed from the third multilayer film, the second interlayer film, the second multilayer film, the first interlayer film. The reflective portion is the second multilayer film exposed from the third multilayer film and the second interlayer film.
申请公布号 US2011287344(A1) 申请公布日期 2011.11.24
申请号 US201113029637 申请日期 2011.02.17
申请人 IRIE SHIGEO 发明人 IRIE SHIGEO
分类号 G03F1/22;G03F1/24;G03F7/20;H01L21/027 主分类号 G03F1/22
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