发明名称 |
RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND |
摘要 |
<p>Disclosed is a radiation-sensitive resin composition which is capable of providing a resist coating film that exhibits excellent drainability on the surface by having a high dynamic contact angle during the exposure in a liquid immersion lithography process, while suppressing occurrence of development defects by being greatly decreased in the dynamic contact angle during the development. The radiation-sensitive resin composition is also capable of reducing the time necessary for change of the dynamic contact angle. Specifically disclosed is a radiation-sensitive resin composition which contains (A) a fluorine-containing polymer that has a structural unit (I) containing a group represented by formula (1), and (B) a radiation-sensitive acid generator.</p> |
申请公布号 |
WO2011145703(A1) |
申请公布日期 |
2011.11.24 |
申请号 |
WO2011JP61588 |
申请日期 |
2011.05.19 |
申请人 |
JSR CORPORATION;OSAKI HITOSHI;ASANO YUSUKE;SATO MITSUO;NAGAI TOMOKI |
发明人 |
OSAKI HITOSHI;ASANO YUSUKE;SATO MITSUO;NAGAI TOMOKI |
分类号 |
G03F7/039;C08F20/30;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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