发明名称 METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON MICROSCOPY
摘要 A 4D electron tomography system includes a stage having one or more degrees of freedom, an electron source, and electron optics operable to direct electron pulses to impinge on a sample supported on the stage. A pulse of the electron pulses impinges on the sample at a first time. The system also includes a laser system and optics operable to direct optical pulses to impinge on the sample. A pulse of the optical pulses impinges on the sample at a second time. The system further includes a detector operable to receive the electron pulses passing through the sample, a controller operable to independently modify an orientation of the stage and at least one of the first time or the second time, a memory operable to store sets of images, and a processor operable to form a 4D tomgraphic image set from the sets of images.
申请公布号 US2011284744(A1) 申请公布日期 2011.11.24
申请号 US20100884001 申请日期 2010.09.16
申请人 ZEWAIL AHMED H.;KWON OH-HOON;ABDELSABOOR OMAR FARGHALY MOHAMMED;YANG DING-SHYUE;CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 ZEWAIL AHMED H.;KWON OH-HOON;ABDELSABOOR OMAR FARGHALY MOHAMMED;YANG DING-SHYUE
分类号 H01J37/28;H01J37/26 主分类号 H01J37/28
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