| 摘要 |
A system and method for determining whether an estimated location of a wireless device includes one or more forged location measurements. A first estimated location of the wireless device using a first set of location measurements is determined, and a second estimated location of the wireless device using a second set of location measurements is determined. The first estimated location may be compared to the second estimated location. One of the determined locations may then be identified as having one or more forged location measurements if the comparison between the first estimated location and second estimated location is greater than a predetermined threshold. The second set of location measurements may be produced using a location technology different than the location technology used to produce the first set of location measurements. |
