发明名称 ELECTRONIC PROBE DEVICE USING EMITTER ARRAY
摘要 <P>PROBLEM TO BE SOLVED: To provide an electronic probe device using an emitter array in which the probe current can be increased while keeping the diameter of a probe. <P>SOLUTION: The electronic probe device comprises: an FE emitter array 1 arranged in the shape of a ring; a lens 2 which focuses a beam of the FE emitter array 1 to a diffraction surface; an iris 3 arranged on the diffraction surface; and an optical system 5 which irradiates a sample 6 with the reduced image of the diaphragm face of the iris 3. The electronic probe device is configured to increase a probe current while keeping the probe diameter of the device. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011238387(A) 申请公布日期 2011.11.24
申请号 JP20100106902 申请日期 2010.05.07
申请人 JEOL LTD 发明人 KATO MAKOTO
分类号 H01J37/06;H01J37/04;H01J37/063;H01J37/073;H01J37/153 主分类号 H01J37/06
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