发明名称 METHOD AND SYSTEM FOR INSPECTING PROBE CARD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and a system for inspecting a probe needle in a short time and with high reliability. <P>SOLUTION: The inspection system 1 is provided with a drive mechanism 29 for making the tips of a plurality of probe needles respectively contact a plurality of touch areas in a common conductive part, a measurement part 32A which constructs a plurality of pairs of probe needles from among the plurality of probe needles 22 and measures electrical characteristics by applying a potential difference across probe needles which forms a pair, and a probe inspection part 32B which determines the quality of each probe needle on the basis of the measured electrical characteristics. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011237199(A) 申请公布日期 2011.11.24
申请号 JP20100106758 申请日期 2010.05.06
申请人 OKI SEMICONDUCTOR CO LTD 发明人 ICHIKI HIDEHIKO;FUKUDA TERUHISA
分类号 G01R1/073;G01R31/28;H01L21/66 主分类号 G01R1/073
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