发明名称 DIELECTRIC STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a dielectric structure formed on a heat-resisting substrate for forming a dielectric on a non-heat resisting substrate, and a peeling transition process to the non-heat resisting substrate of a dielectric film. <P>SOLUTION: The dielectric structure 1 has a first substrate 5, an oxide film 4 and a first electrode layer 3 formed on the first substrate 5, and a dielectric layer 2 formed on the first electrode layer 3. Between the first substrate 5 and the first electrode layer 3, a coupling layer 6 formed by Ti and the like so as to cover at least a part of the first substrate 5 is provided. By optimizing the mechanical characteristics of an interface according to residual stress in the dielectric after forming, the peeling characteristics of the interface in which the dielectric layer 2 and the electrode layer 3 is not peeled from the heat-resisting substrate in a forming process and peeled in a transition process can be obtained. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011238766(A) 申请公布日期 2011.11.24
申请号 JP20100108684 申请日期 2010.05.10
申请人 JAPAN SCIENCE & TECHNOLOGY AGENCY;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 ICHIKI MASAAKI;SUGA TADATOMO;IIMURA KEITA;HOSONO TOMOHITO;ITO HISAHIRO;MAEDA RYUTARO
分类号 H01G4/33;H01G4/12;H01L41/08;H01L41/09;H01L41/18;H01L41/22;H01L41/312;H01L41/39 主分类号 H01G4/33
代理机构 代理人
主权项
地址