发明名称 |
METHOD FOR FORMING JUNCTION OF VERTICAL CELL IN SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A joining formation of the vertical cell of a semiconductor device is provided to prevent dopant to be expanded in a domain except a junction domain when forming junction by follow anneal by forming in advance a doping barrier layer on the surface of an insulating layer in which an opening is formed. CONSTITUTION: An active area(203) which is separated by a trench(202) is formed on a substrate(201). A hard mask film(204) is formed on the top of the active area. An insulating layer having an opening which exposes a part of the sidewall of the active area is formed. A doping barrier layer(209) is formed on the surface of the insulating layer. The insulating layer comprises an oxide film and the doping barrier layer comprises a film in which the oxide film is nitrified. A junction(212) is formed in the part of the sidewall which is exposed.</p> |
申请公布号 |
KR20110125738(A) |
申请公布日期 |
2011.11.22 |
申请号 |
KR20100045257 |
申请日期 |
2010.05.14 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, TAE YOON;EUN, YONG SEOK;KIM, MIN SOO |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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