发明名称 Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions
摘要 The present invention relates to aqueous compositions comprising amidoxime compounds and methods for cleaning plasma etch residue from semiconductor substrates including such dilute aqueous solutions. The compositions of the invention may optionally contain one or more other acid compounds, one or more basic compounds, and a fluoride-containing compound and additional components such as organic solvents, chelating agents, amines, and surfactants. The invention also relates to a method of removing residue from a substrate during integrated circuit fabrication.
申请公布号 US8062429(B2) 申请公布日期 2011.11.22
申请号 US20080260625 申请日期 2008.10.29
申请人 LEE WAI MUN;EKC TECHNOLOGY, INC. 发明人 LEE WAI MUN
分类号 B08B6/00 主分类号 B08B6/00
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