发明名称 ELECTRONIC COMPONENT TESTING DEVICE AND ELECTRONIC COMPONENT TRANSPORT METHOD
摘要 PURPOSE: An electric component test apparatus and an electric component returning method are provided to maintain the stability of grip force of an electric component by sanctioning pressure to an inspection socket in a non contact state between the contact terminal of a grip part and a first surface electrode of the electric component. CONSTITUTION: An electric component test apparatus comprises a base(11), a safety cover(12), a hot chamber(13), a supply robot(14), a collection robot(15), a first shuttle(16), a second shuttle(17), and plurality of conveyors(C1-C6). The safety cover surrounds a big domain of the base. The supply robot, the collection robot, the first shuttle, and the second shuttle are located inside the safety cover. One end part of the conveyor is located in the outside of the safety cover. A tray(18) is returned from the outside of the safety cover to the inside of the safety cover.
申请公布号 KR20110126060(A) 申请公布日期 2011.11.22
申请号 KR20110044974 申请日期 2011.05.13
申请人 SEIKO EPSON CORPORATION 发明人 SHIOZAWA MASAKUNI
分类号 G01R31/26 主分类号 G01R31/26
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