METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF GENERATING NOISE FOR TESTING THE SAME

摘要

PURPOSE: A method for testing a semiconductor device and a noise generating method therefor are provided to accurately determine a steady operation state of the semiconductor device by introducing new parameter like the elimination of a power pin or the limit of power supply. CONSTITUTION: Power supply is cut through a power pin(S100). The power pin is able to be formed into a predetermined pad which is formed on the chip of a semiconductor device. A switch is included in the inner side of the semiconductor device. Power is supplied to rest power pins except for the power pin in which power is cut. A test pattern is applied in the semiconductor device having the power pin which power is cut(S200). An operation of the semiconductor device in which the test pattern is applied is determined(S300).