| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique in which the thickness of a skin horny layer of 1-10 μm, which conventionally cannot be measured, can be measured with ease and high accuracy by using terahertz wave. <P>SOLUTION: In a technique in which the thickness of a skin horny layer is measured with ease and accuracy, at a transmission-reflection method using terahertz wave, the interference phenomenon occurring due to the sandwiching of the skin horny layer as a analyte by a mirror and a silicone is utilized or a metal mesh method using terahertz wave is utilized. <P>COPYRIGHT: (C)2012,JPO&INPIT |
