发明名称 |
COLOR FILTER SUBSTRATE INSPECTION METHOD AND INSPECTION DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and a device for inspecting a foreign body attached on a substrate for a liquid crystal display apparatus in terms of its conductivity. <P>SOLUTION: In a method for inspecting to determine whether or not metal elements are contained in a foreign body attached to a substrate for a liquid crystal display apparatus, a comparison X-ray fluorescence spectrum of positions where no foreign body exists is performed beforehand once with respect to the predetermined number of the substrates to be inspected and an X-ray fluorescence spectrum of at least one position where a foreign body is attached to the substrate are measured. In this way, a plurality of X-ray fluorescence spectra are subject to data processing, thereby determining with high accuracy whether or not the foreign body contains metal elements. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011232204(A) |
申请公布日期 |
2011.11.17 |
申请号 |
JP20100103367 |
申请日期 |
2010.04.28 |
申请人 |
RIGAKU CORP;TOPPAN PRINTING CO LTD |
发明人 |
NAKANO ASAO;SAITO JUNICHI;CHOI HAE YONG;INABA KATSUHIKO;NONOGUCHI MASAHIRO |
分类号 |
G01N23/223;G01N21/88;G02F1/13 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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