发明名称 SELF-DIAGNOSIS SYSTEM AND INSPECTION CIRCUIT DETERMINATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a self-diagnosis system and an inspection circuit determination method that allow determination of normality of an inspection circuit for executing an diagnosis of a test target circuit. <P>SOLUTION: The self-diagnosis system of the present invention comprises: an inspection circuit 30 having diagnostic controllers 31 and 32 for determining normality of a test target circuit 10 by using a test pattern execution result of the test target circuit 10; and an inspection circuit determination part 20 for determining normality of the inspection circuit 30 by comparing a normality determination result of the test target circuit 10 which is output from the diagnostic controller 31 with a normality determination result of the test target circuit 10 which is output from the diagnostic controller 32. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011232031(A) 申请公布日期 2011.11.17
申请号 JP20100099582 申请日期 2010.04.23
申请人 RENESAS ELECTRONICS CORP 发明人 MATSUO MASAFUMI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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