| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problem that accuracy of a current to be measured cannot be sufficiently ensured in a conventional measurement method. <P>SOLUTION: A semiconductor device includes: an external terminal TM; a phase frequency comparator 11 which controls a charge pump circuit 12 in accordance with the phase and frequency of an output signal; the charge pump circuit 12 which outputs a current to a frequency control voltage generation node VND; a loop filter 14 which generates a frequency control voltage on the frequency control voltage generation node VND in accordance with the current outputted from the charge pump circuit 12; and a voltage controlled oscillator 15 which controls the frequency of the output signal in accordance with the frequency control voltage. A measurement method for the semiconductor device measures one of first and second currents to be measured including the output current of the charge pump circuit 12 via the external terminal TM, and a third current to be measured including a leakage current flowing to the external terminal TM, and calculates a current value of an outflow current IS1 or an inflow current IS2 on the basis of differences between the first or second measured current and the leakage current. <P>COPYRIGHT: (C)2012,JPO&INPIT |
