| 摘要 |
What is disclosed is a novel system and method for quickly characterizing a reflectance sensing device without measuring the full set of characterization color patch training samples currently used in manufacturing and characterizing individual sensors. In accordance with the teachings hereof, measurements of training samples taken with a previously manufactured ‘fleet master’ sensing device are adapted, in a manner more fully disclosed herein, based upon knowledge of the wavelengths of the illuminators used for both the subject and fleet master sensors, as well as spectral reflectance response of the training samples as measured by a reference spectrophotometer device. Utilizing the adapted measurements of the fleet master device, a reconstruction matrix can be quickly constructed for the subject sensor. The present system and method provides reasonably good accuracy using pre-existing measurement data. This results in manufacturing cost savings on a per-sensor basis. |
